Skip navigation
Search
Researchers
Navigation
Faculties
Browse Items by:
Issue Date
Author
Title
Keyword
Guide
Sign on to
My DSpace
Receive email
updates
中文
|
English
Browsing by Author Wang, Runsheng
Jump to:
0-9
A
B
C
D
E
F
G
H
I
J
K
L
M
N
O
P
Q
R
S
T
U
V
W
X
Y
Z
Sort by:
title
issue date
submit date
In order:
Ascending
Descending
Results/Page
5
10
15
20
25
30
35
40
45
50
55
60
65
70
75
80
85
90
95
100
Authors/Record:
All
1
5
10
15
20
25
30
35
40
45
50
Showing results 1 to 20 of 219
next >
Issue Date
Title
Author(s)
2021
A 16Kb Transpose 6T SRAM In-Memory-Computing Macro based on Robust Charge-Domain Computing
Song, Jiahao
;
Wang, Yuan
;
Tang, Xiyuan
;
Wang, Runsheng
;
Huang, Ru
Feb-2023
A 28 nm 16 Kb Bit-Scalable Charge-Domain Transpose 6T SRAM In-Memory Computing Macro
Song, Jiahao
;
Tang, Xiyuan
;
Qiao, Xin
;
Wang, Yuan
;
Wang, Runsheng
;
Huang, Ru
2022
A 28-nm 198.9-TOPS/W Fault-Tolerant Stochastic Computing Neural Network Processor
Hu, Yixuan
;
Zhang, Yawen
;
Wang, Runsheng
;
Zhang, Zuodong
;
Song, Jiahao
;
Tang, Xiyuan
;
Qian, Weikang
;
Wang, Yanzhi
;
Wang, Yuan
;
Huang, Ru
2022
A 3T eDRAM In-Memory Physically Unclonable Function With Spatial Majority Voting Stabilization
Song, Jiahao
;
Luo, Haoyang
;
Tang, Xiyuan
;
Xu, Kuan
;
Ji, Zhigang
;
Wang, Yuan
;
Wang, Runsheng
;
Huang, Ru
Jun-2022
A 65 nm 73 kb SRAM-Based Computing-In-Memory Macro With Dynamic-Sparsity Controlling
Qiao, Xin
;
Song, Jiahao
;
Tang, Xiyuan
;
Luo, Haoyang
;
Pan, Nanbing
;
Cui, Xiaoxin
;
Wang, Runsheng
;
Wang, Yuan
2015
Accelerated Aging in Analog and Digital Circuits With Feedback
Sutaria, Ketul B.
;
Mohanty, Abinash
;
Wang, Runsheng
;
Huang, Ru
;
Cao, Yu
2020
Accurate and Energy-Efficient Implementation of Non-Linear Adder in Parallel Stochastic Computing Using Sorting Network
Zhang, Yawen
;
Wang, Runsheng
;
Hu, Yixuan
;
Qian, Weikang
;
Wang, Yanzhi
;
Wang, Yuan
;
Huang, Ru
Feb-2023
Adaptive Multioutput Gradient RBF Tracker for Nonlinear and Nonstationary Regression
Sun, Zixuan
;
Wang, Zirui
;
Wang, Runsheng
;
Zhang, Lining
;
Zhang, Jiayang
;
Zhang, Zuodong
;
Song, Jiahao
;
Wang, Da
;
Ji, Zhigang
;
Huang, Ru
2015
Adding the Missing Time-Dependent Layout Dependency into Device-Circuit-Layout Co-Optimization -New Findings on the Layout Dependent Aging Effects
Ren, Pengpeng
;
Xu, Xiaoqing
;
Hao, Peng
;
Wang, Junyao
;
Wang, Runsheng
;
Li, Ming
;
Wang, Jianping
;
Bu, Weihai
;
Wu, Jingang
;
Wong, Waisum
;
Yu, Shaofeng
;
Wu, Hanming
;
Lee, Shiuh-Wuu
;
Pan, David Z.
;
Huang, Ru
2016
Adding the missing time-dependent layout dependency into device-circuit-layout co-optimization-New findings on the layout dependent aging effects
Ren, Pengpeng
;
Xu, Xiaoqing
;
Hao, Peng
;
Wang, Junyao
;
Wang, Runsheng
;
Li, Ming
;
Wang, Jianping
;
Bu, Weihai
;
Wu, Jingang
;
Wong, Waisum
;
Yu, Shaofeng
;
Wu, Hanming
;
Lee, Shiuh-Wuu
;
Pan, David Z.
;
Huang, Ru
Sep-2021
Aging-Aware Gate-Level Modeling for Circuit Reliability Analysis
Zhang, Zuodong
;
Wang, Runsheng
;
Shen, Xuguang
;
Wu, Dehuang
;
Zhang, Jiayang
;
Zhang, Zhe
;
Wang, Joddy
;
Huang, Ru
2007
Analog/RF performance of Si nanowire MOSFETs and the impact of process variation
Wang, Runsheng
;
Zhuge, Jing
;
Huang, Ru
;
Tian, Yu
;
Xiao, Han
;
Zhang, Liangliang
;
Li, Chen
;
Zhang, Xing
;
Wang, Yangyuan
2017
Anomalous random telegraph noise in nanoscale transistors as direct evidence of two metastable states of oxide traps
Guo, Shaofeng
;
Wang, Runsheng
;
Mao, Dongyuan
;
Wang, Yangyuan
;
Huang, Ru
Jul-2020
Bias and geometry dependence of total-ionizing-dose effects in SOI FinFETs
Ren, Zhexuan
;
An, Xia
;
Li, Gensong
;
Wang, Runsheng
;
Xu, Nuo
;
Zhang, Xing
;
Huang, Ru
Jan-2022
Body Bias Dependence of Bias Temperature Instability (BTI) in Bulk FinFET Technology
Zhang, Jiayang
;
Wang, Zirui
;
Wang, Runsheng
;
Sun, Zixuan
;
Huang, Ru
2018
Body Bias Dependence of Hot Carrier Degradation (HCD) in Advanced FinFET Technology
Zhang, Jiayang
;
Sun, Zixuan
;
Wang, Runsheng
;
Yu, Zhuoqing
;
Ren, Pengpeng
;
Huang, Ru
2021
Can Emerging Computing Paradigms Help Enhancing Reliability Towards the End of Technology Roadmap?
Wang, Runsheng
;
Zhang, Zuodong
;
Zhang, Yawen
;
Hu, Yixuan
;
Sun, Yanan
;
Qian, Weikang
;
Huang, Ru
2017
Changes in the Editorial Board
Ghione, Giovanni
;
Chauhan, Yogesh Singh
;
Kalna, Karol
;
Verzellesi, Giovanni
;
Wang, Runsheng
2008
Characteristics and fluctuation of negative bias temperature instability in Si nanowire field-effect transistors
Wang, Runsheng
;
Huang, Ru
;
He, Yandong
;
Wang, Zhenhua
;
Jia, Gaosheng
;
Kim, Dong-Won
;
Park, Donggun
;
Wang, Yangyuan
2010
Characteristics of Gate Current Random Telegraph Signal Noise in SiON/HfO2/TaN p-Type Metal-Oxide-Semiconductor Field-Effect Transistors under Negative Bias Temperature Instability Stress Condition
Zhang, Liangliang
;
Liu, Changze
;
Wang, Runsheng
;
Huang, Ru
;
Yu, Tao
;
Zhuge, Jing
;
Kirsch, Paul
;
Tseng, Hsing-Huang
;
Wang, Yangyuan
map