Browsing by Author Wang, Runsheng

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Issue Date Title Author(s)
2021 A 16Kb Transpose 6T SRAM In-Memory-Computing Macro based on Robust Charge-Domain Computing Song, Jiahao;Wang, Yuan;Tang, Xiyuan;Wang, Runsheng;Huang, Ru
Feb-2023 A 28 nm 16 Kb Bit-Scalable Charge-Domain Transpose 6T SRAM In-Memory Computing Macro Song, Jiahao;Tang, Xiyuan;Qiao, Xin;Wang, Yuan;Wang, Runsheng;Huang, Ru
2022 A 28-nm 198.9-TOPS/W Fault-Tolerant Stochastic Computing Neural Network Processor Hu, Yixuan;Zhang, Yawen;Wang, Runsheng;Zhang, Zuodong;Song, Jiahao;Tang, Xiyuan;Qian, Weikang;Wang, Yanzhi;Wang, Yuan;Huang, Ru
2022 A 3T eDRAM In-Memory Physically Unclonable Function With Spatial Majority Voting Stabilization Song, Jiahao;Luo, Haoyang;Tang, Xiyuan;Xu, Kuan;Ji, Zhigang;Wang, Yuan;Wang, Runsheng;Huang, Ru
Jun-2022 A 65 nm 73 kb SRAM-Based Computing-In-Memory Macro With Dynamic-Sparsity Controlling Qiao, Xin;Song, Jiahao;Tang, Xiyuan;Luo, Haoyang;Pan, Nanbing;Cui, Xiaoxin;Wang, Runsheng;Wang, Yuan
2015 Accelerated Aging in Analog and Digital Circuits With Feedback Sutaria, Ketul B.;Mohanty, Abinash;Wang, Runsheng;Huang, Ru;Cao, Yu
2020 Accurate and Energy-Efficient Implementation of Non-Linear Adder in Parallel Stochastic Computing Using Sorting Network Zhang, Yawen;Wang, Runsheng;Hu, Yixuan;Qian, Weikang;Wang, Yanzhi;Wang, Yuan;Huang, Ru
Feb-2023 Adaptive Multioutput Gradient RBF Tracker for Nonlinear and Nonstationary Regression Sun, Zixuan;Wang, Zirui;Wang, Runsheng;Zhang, Lining;Zhang, Jiayang;Zhang, Zuodong;Song, Jiahao;Wang, Da;Ji, Zhigang;Huang, Ru
2015 Adding the Missing Time-Dependent Layout Dependency into Device-Circuit-Layout Co-Optimization -New Findings on the Layout Dependent Aging Effects Ren, Pengpeng;Xu, Xiaoqing;Hao, Peng;Wang, Junyao;Wang, Runsheng;Li, Ming;Wang, Jianping;Bu, Weihai;Wu, Jingang;Wong, Waisum;Yu, Shaofeng;Wu, Hanming;Lee, Shiuh-Wuu;Pan, David Z.;Huang, Ru
2016 Adding the missing time-dependent layout dependency into device-circuit-layout co-optimization-New findings on the layout dependent aging effects Ren, Pengpeng;Xu, Xiaoqing;Hao, Peng;Wang, Junyao;Wang, Runsheng;Li, Ming;Wang, Jianping;Bu, Weihai;Wu, Jingang;Wong, Waisum;Yu, Shaofeng;Wu, Hanming;Lee, Shiuh-Wuu;Pan, David Z.;Huang, Ru
Sep-2021 Aging-Aware Gate-Level Modeling for Circuit Reliability Analysis Zhang, Zuodong;Wang, Runsheng;Shen, Xuguang;Wu, Dehuang;Zhang, Jiayang;Zhang, Zhe;Wang, Joddy;Huang, Ru
2007 Analog/RF performance of Si nanowire MOSFETs and the impact of process variation Wang, Runsheng;Zhuge, Jing;Huang, Ru;Tian, Yu;Xiao, Han;Zhang, Liangliang;Li, Chen;Zhang, Xing;Wang, Yangyuan
2017 Anomalous random telegraph noise in nanoscale transistors as direct evidence of two metastable states of oxide traps Guo, Shaofeng;Wang, Runsheng;Mao, Dongyuan;Wang, Yangyuan;Huang, Ru
Jul-2020 Bias and geometry dependence of total-ionizing-dose effects in SOI FinFETs Ren, Zhexuan;An, Xia;Li, Gensong;Wang, Runsheng;Xu, Nuo;Zhang, Xing;Huang, Ru
Jan-2022 Body Bias Dependence of Bias Temperature Instability (BTI) in Bulk FinFET Technology Zhang, Jiayang;Wang, Zirui;Wang, Runsheng;Sun, Zixuan;Huang, Ru
2018 Body Bias Dependence of Hot Carrier Degradation (HCD) in Advanced FinFET Technology Zhang, Jiayang;Sun, Zixuan;Wang, Runsheng;Yu, Zhuoqing;Ren, Pengpeng;Huang, Ru
2021 Can Emerging Computing Paradigms Help Enhancing Reliability Towards the End of Technology Roadmap? Wang, Runsheng;Zhang, Zuodong;Zhang, Yawen;Hu, Yixuan;Sun, Yanan;Qian, Weikang;Huang, Ru
2017 Changes in the Editorial Board Ghione, Giovanni;Chauhan, Yogesh Singh;Kalna, Karol;Verzellesi, Giovanni;Wang, Runsheng
2008 Characteristics and fluctuation of negative bias temperature instability in Si nanowire field-effect transistors Wang, Runsheng;Huang, Ru;He, Yandong;Wang, Zhenhua;Jia, Gaosheng;Kim, Dong-Won;Park, Donggun;Wang, Yangyuan
2010 Characteristics of Gate Current Random Telegraph Signal Noise in SiON/HfO2/TaN p-Type Metal-Oxide-Semiconductor Field-Effect Transistors under Negative Bias Temperature Instability Stress Condition Zhang, Liangliang;Liu, Changze;Wang, Runsheng;Huang, Ru;Yu, Tao;Zhuge, Jing;Kirsch, Paul;Tseng, Hsing-Huang;Wang, Yangyuan