Browsing by Author Wang, Joddy
Showing results 1 to 2 of 2
Issue Date | Title | Author(s) |
Sep-2021 | Aging-Aware Gate-Level Modeling for Circuit Reliability Analysis | Zhang, Zuodong; Wang, Runsheng; Shen, Xuguang; Wu, Dehuang; Zhang, Jiayang; Zhang, Zhe; Wang, Joddy; Huang, Ru |
2018 | Too Noisy at the Bottom? -Random Telegraph Noise (RTN) in Advanced Logic Devices and Circuits | Wang, Runsheng; Guo, Shaofeng; Zhang, Zhe; Wang, Qingxue; Wu, Dehuang; Wang, Joddy; Huang, Ru |