| Issue Date |
Title |
Author(s) |
| 2007 |
A 0.4-V low noise amplifier using forward body bias technology for 5 GHz application |
Wu, Dake;Huang, Ru;Wong, Waisum;Wang, Yangyuan |
| 2015 |
Adding the Missing Time-Dependent Layout Dependency into Device-Circuit-Layout Co-Optimization -New Findings on the Layout Dependent Aging Effects |
Ren, Pengpeng;Xu, Xiaoqing;Hao, Peng;Wang, Junyao;Wang, Runsheng;Li, Ming;Wang, Jianping;Bu, Weihai;Wu, Jingang;Wong, Waisum;Yu, Shaofeng;Wu, Hanming;Lee, Shiuh-Wuu;Pan, David Z.;Huang, Ru |
| 2016 |
Adding the missing time-dependent layout dependency into device-circuit-layout co-optimization-New findings on the layout dependent aging effects |
Ren, Pengpeng;Xu, Xiaoqing;Hao, Peng;Wang, Junyao;Wang, Runsheng;Li, Ming;Wang, Jianping;Bu, Weihai;Wu, Jingang;Wong, Waisum;Yu, Shaofeng;Wu, Hanming;Lee, Shiuh-Wuu;Pan, David Z.;Huang, Ru |
| 2008 |
Anomalous negative bias temperature instability degradation induced by source/drain bias in nanoscale PMOS devices |
Yan, Baoguang;Yang, Jingfeng;Xia, Zhiliang;Liu, Xiaoyan;Du, Gang;Han, Ruqi;Kang, Jinfeng;Liao, C. C.;Gan, Zhenghao;Liao, Miao;Wang, J. P.;Wong, Waisum |
| 2009 |
A control-gate-assisted erasing method for a single-poly EEPROM cell with metallic control gate structure |
Wu, Dake;Huang, Ru;Wong, Waisum;Wang, Yangyuan |
| 2013 |
Deep understanding of AC RTN in MuGFETs through new characterization method and impacts on logic circuits |
Zou, Jibin;Wang, Runsheng;Luo, Mulong;Huang, Ru;Xu, Nuo;Ren, Pengpeng;Liu, Changze;Xiong, Weize;Wang, Jianping;Liu, Jinhua;Wu, Jingang;Wong, Waisum;Yu, Shaofeng;Wu, Hanming;Lee, Shiuh-Wuu;Wang, Yangyuan |
| 2015 |
DTMOS mode as an effective solution of RTN suppression for robust device/circuit co-design |
Guo, Shaofeng;Huang, Ru;Hao, Peng;Luo, Mulong;Ren, Pengpeng;Wang, Jianping;Bu, Weihai;Wu, Jingang;Wong, Waisum;Yu, Scott;Wu, Hanming;Lee, Shiuh-Wuu;Wang, Runsheng;Wang, Yangyuan |
| 2015 |
New insights into the design for end-of-life variability of NBTI in scaled high-��/metal-gate Technology for the nano-reliability era |
Ren, Pengpeng;Wang, Runsheng;Ji, Zhigang;Hao, Peng;Jiang, Xiaobo;Guo, Shaofeng;Luo, Mulong;Duan, Meng;Zhang, Jian F.;Wang, Jianping;Liu, Jinhua;Bu, Weihai;Wu, Jingang;Wong, Waisum;Yu, Shaofeng;Wu, Hanming;Lee, Shiuh-Wuu;Xu, Nuo;Huang, Ru |
| 2018 |
New insights into the HCI degradation of pass-gate transistor in advanced FinFET technology |
Ren, Pengpeng;Liu, Changze;Wan, Sanping;Zhang, Jiayang;Yu, Zhuoqing;Liu, Nie;Sun, Yongsheng;Wang, Runsheng;Zhan, Canhui;Gan, Zhenghao;Wong, Waisum;Xia, Yu;Huang, Ru |
| 2013 |
New Observations on Complex RTN in Scaled High-kappa/Metal-gate MOSFETs - the Role of Defect Coupling under DC/AC Condition |
Ren, Pengpeng;Hao, Peng;Liu, Changze;Wang, Runsheng;Jiang, Xiaobo;Qin, Yingxin;Huang, Ru;Guo, Shaofeng;Luo, Mulong;Zou, Jibin;Li, Meng;Wang, Jianping;Wu, Jingang;Liu, Jinhua;Bu, Weihai;Wong, Waisum;Yu, Scott;Wu, Hanming;Lee, Shiuh-Wuu;Wang, Yangyuan |
| 2013 |
New observations on complex RTN in scaled high-��/metal-gate MOSFETs - The role of defect coupling under DC/AC condition |
Ren, Pengpeng;Hao, Peng;Liu, Changze;Wang, Runsheng;Jiang, Xiaobo;Qiu, Yingxin;Huang, Ru;Guo, Shaofeng;Luo, Mulong;Zou, Jibin;Li, Meng;Wang, Jianping;Wu, Jingang;Liu, Jinhua;Bu, Weihai;Wong, Waisum;Yu, Scott;Wu, Hanming;Lee, Shiuh-Wuu;Wang, Yangyuan |
| 2015 |
New understanding of state-loss in complex RTN: Statistical experimental study, trap interaction models, and impact on circuits |
Zou, Jibin;Wang, Runsheng;Guo, Shaofeng;Luo, Mulong;Yu, Zhuoqing;Jiang, Xiaobo;Ren, Pengpeng;Wang, Jianping;Liu, Jinhua;Wu, Jingang;Wong, Waisum;Yu, Shaofeng;Wu, Hanming;Lee, Shiuh-Wuu;Wang, Yangyuan;Huang, Ru |
| 2009 |
A Novel RF LDMOS Fabricated With Standard Foundry Technology |
Xiao, Han;Zhang, Lijie;Huang, Ru;Song, Fei;Wu, Dake;Liao, Huailin;Wong, Waisum;Wang, Yangyuan |
| 2013 |
A Unified Approach for Trap-Aware Device/Circuit Co-Design in Nanoscale CMOS Technology |
Wang, Runsheng;Luo, Mulong;Guo, Shaofeng;Huang, Ru;Liu, Changze;Zou, Jibin;Wang, Jianping;Wu, Jingang;Xu, Nuo;Wong, Waisum;Yu, Scott;Wu, Hanming;Lee, Shiuh-Wuu;Wang, Yangyuan |
| 2009 |
A Wideband Predictive "Double-pi" Equivalent-Circuit Model for On-Chip Spiral Inductors |
Wang, Chuan;Liao, Huailin;Li, Chen;Huang, Ru;Wong, Waisum;Zhang, Xin;Wang, Yangyuan |
