| Issue Date |
Title |
Author(s) |
| 2015 |
Adding the Missing Time-Dependent Layout Dependency into Device-Circuit-Layout Co-Optimization -New Findings on the Layout Dependent Aging Effects |
Ren, Pengpeng;Xu, Xiaoqing;Hao, Peng;Wang, Junyao;Wang, Runsheng;Li, Ming;Wang, Jianping;Bu, Weihai;Wu, Jingang;Wong, Waisum;Yu, Shaofeng;Wu, Hanming;Lee, Shiuh-Wuu;Pan, David Z.;Huang, Ru |
| 2016 |
Adding the missing time-dependent layout dependency into device-circuit-layout co-optimization-New findings on the layout dependent aging effects |
Ren, Pengpeng;Xu, Xiaoqing;Hao, Peng;Wang, Junyao;Wang, Runsheng;Li, Ming;Wang, Jianping;Bu, Weihai;Wu, Jingang;Wong, Waisum;Yu, Shaofeng;Wu, Hanming;Lee, Shiuh-Wuu;Pan, David Z.;Huang, Ru |
| 2017 |
Circuit-Level ESD Protection Simulation Using Behavior Models in 28nm CMOS |
Zhang, Feilong;Wang, Chenkun;Lu, Fei;Chen, Qi;Li, Cheng;Wang, Albert;Li, Daguang;Yu, Shaofeng;Zhu, Chengyu;Tang, Tianshen;Cheng, Yuhua |
| 2016 |
Deep Insights into Dielectric Breakdown in Tunnel FETs with Awareness of Reliability and Performance Co-Optimization |
Huang, Qianqian;Jia, Rundong;Zhu, Jiadi;Lv, Zhu;Wang, Jiaxin;Chen, Cheng;Zhao, Yang;Wang, Runsheng;Bu, Weihai;Wang, Wenbo;Kang, Jin;Hua, Kelu;Wu, Hanming;Yu, Shaofeng;Wang, Yangyuan;Huang, Ru |
| 2013 |
Deep understanding of AC RTN in MuGFETs through new characterization method and impacts on logic circuits |
Zou, Jibin;Wang, Runsheng;Luo, Mulong;Huang, Ru;Xu, Nuo;Ren, Pengpeng;Liu, Changze;Xiong, Weize;Wang, Jianping;Liu, Jinhua;Wu, Jingang;Wong, Waisum;Yu, Shaofeng;Wu, Hanming;Lee, Shiuh-Wuu;Wang, Yangyuan |
| 2012 |
New insights into AC RTN in scaled high-��/ metal-gate MOSFETs under digital circuit operations |
Zou, Jibin;Wang, Runsheng;Gong, Nanbo;Huang, Ru;Xu, Xiaoqing;Ou, Jiaojiao;Liu, Changze;Wang, Jianping;Liu, Jinhua;Wu, Jingang;Yu, Shaofeng;Ren, Pengpeng;Wu, Hanming;Lee, Shiuh-Wuu;Wang, Yangyuan |
| 2015 |
New insights into the design for end-of-life variability of NBTI in scaled high-��/metal-gate Technology for the nano-reliability era |
Ren, Pengpeng;Wang, Runsheng;Ji, Zhigang;Hao, Peng;Jiang, Xiaobo;Guo, Shaofeng;Luo, Mulong;Duan, Meng;Zhang, Jian F.;Wang, Jianping;Liu, Jinhua;Bu, Weihai;Wu, Jingang;Wong, Waisum;Yu, Shaofeng;Wu, Hanming;Lee, Shiuh-Wuu;Xu, Nuo;Huang, Ru |
| 2012 |
New Observations on AC NBTI induced Dynamic Variability in Scaled High-kappa/Metal-gate MOSFETs: Characterization, Origin of Frequency Dependence, and Impacts on Circuits |
Liu, Changze;Ren, Pengpeng;Wang, Runsheng;Huang, Ru;Ou, Jiaojiao;Huang, Qianqian;Zou, Jibin;Wang, Jianping;Wu, Jingang;Yu, Shaofeng;Wu, Hanming;Lee, Shiuh-Wuu;Wang, Yangyuan |
| 2012 |
New observations on AC NBTI induced dynamic variability in scaled high-��/Metal-gate MOSFETs: Characterization, origin of frequency dependence, and impacts on circuits |
Liu, Changze;Ren, Pengpeng;Wang, Runsheng;Huang, Ru;Ou, Jiaojiao;Huang, Qianqian;Zou, Jibin;Wang, Jianping;Wu, Jingang;Yu, Shaofeng;Wu, Hanming;Lee, Shiuh-Wuu;Wang, Yangyuan |
| 2015 |
New understanding of state-loss in complex RTN: Statistical experimental study, trap interaction models, and impact on circuits |
Zou, Jibin;Wang, Runsheng;Guo, Shaofeng;Luo, Mulong;Yu, Zhuoqing;Jiang, Xiaobo;Ren, Pengpeng;Wang, Jianping;Liu, Jinhua;Wu, Jingang;Wong, Waisum;Yu, Shaofeng;Wu, Hanming;Lee, Shiuh-Wuu;Wang, Yangyuan;Huang, Ru |
