| Issue Date |
Title |
Author(s) |
| 2014 |
Compact Modeling of Random Telegraph Noise in Nanoscale MOSFETs and Impacts on Digital Circuits |
Luo, Mulong;Wang, Runsheng;Wang, Jing;Guo, Shaofeng;Zou, Jibin;Huang, Ru |
| 2013 |
Deep understanding of AC RTN in MuGFETs through new characterization method and impacts on logic circuits |
Zou, Jibin;Wang, Runsheng;Luo, Mulong;Huang, Ru;Xu, Nuo;Ren, Pengpeng;Liu, Changze;Xiong, Weize;Wang, Jianping;Liu, Jinhua;Wu, Jingang;Wong, Waisum;Yu, Shaofeng;Wu, Hanming;Lee, Shiuh-Wuu;Wang, Yangyuan |
| 2016 |
Deep Understanding of Random Telegraph Noise (RTN) Effects on SRAM Stability |
Mao, Dongyuan;Guo, Shaofeng;Wang, Runsheng;Luo, Mulong;Huang, Ru |
| 2016 |
Deep understanding of random telegraph noise (RTN) effects on SRAM stability |
Mao, Dongyuan;Guo, Shaofeng;Wang, Runsheng;Luo, Mulong;Huang, Ru |
| 2015 |
DTMOS mode as an effective solution of RTN suppression for robust device/circuit co-design |
Guo, Shaofeng;Huang, Ru;Hao, Peng;Luo, Mulong;Ren, Pengpeng;Wang, Jianping;Bu, Weihai;Wu, Jingang;Wong, Waisum;Yu, Scott;Wu, Hanming;Lee, Shiuh-Wuu;Wang, Runsheng;Wang, Yangyuan |
| 2015 |
Impacts of Random Telegraph Noise (RTN) on Digital Circuits |
Luo, Mulong;Wang, Runsheng;Guo, Shaofeng;Wang, Jing;Zou, Jibin;Huang, Ru |
| 2016 |
IMPACTS OF RANDOM TELEGRAPH NOISE (RTN) ON THE ENERGY DELAY TRADEOFFS OF LOGIC CIRCUITS |
Zhang, Yang;Jiang, Xiaobo;Wang, Junyao;Guo, Shaofeng;Fang, Yichen;Wang, Runsheng;Luo, Mulong;Huang, Ru |
| 2016 |
Impacts of random telegraph noise (RTN) on the Energy-Delay tradeoffs of logic circuits |
Zhang, Yang;Jiang, Xiaobo;Wang, Junyao;Guo, Shaofeng;Fang, Yichen;Wang, Runsheng;Luo, Mulong;Huang, Ru |
| 2018 |
Investigation on NBTI-induced dynamic variability in nanoscale CMOS devices: Modeling, experimental evidence, and impact on circuits |
Guo, Shaofeng;Wang, Runsheng;Ren, Pengpeng;Liu, Changze;Luo, Mulong;Jiang, Xiaobo;Wang, Yangyuan;Huang, Ru |
| 2014 |
New Efficient Method for Characterizing Time Constants of Switching Oxide Traps |
Guo, Shaofeng;Ren, Pengpeng;Wang, Runsheng;Yu, Zhuoqing;Luo, Mulong;Zhang, Xing;Huang, Ru |
| 2014 |
A new efficient method for characterizing time constants of switching oxide traps |
Guo, Shaofeng;Ren, Pengpeng;Wang, Runsheng;Yu, Zhuoqing;Luo, Mulong;Zhang, Xing;Huang, Ru |
| 2015 |
New insights into the design for end-of-life variability of NBTI in scaled high-��/metal-gate Technology for the nano-reliability era |
Ren, Pengpeng;Wang, Runsheng;Ji, Zhigang;Hao, Peng;Jiang, Xiaobo;Guo, Shaofeng;Luo, Mulong;Duan, Meng;Zhang, Jian F.;Wang, Jianping;Liu, Jinhua;Bu, Weihai;Wu, Jingang;Wong, Waisum;Yu, Shaofeng;Wu, Hanming;Lee, Shiuh-Wuu;Xu, Nuo;Huang, Ru |
| 2013 |
New Observations on Complex RTN in Scaled High-kappa/Metal-gate MOSFETs - the Role of Defect Coupling under DC/AC Condition |
Ren, Pengpeng;Hao, Peng;Liu, Changze;Wang, Runsheng;Jiang, Xiaobo;Qin, Yingxin;Huang, Ru;Guo, Shaofeng;Luo, Mulong;Zou, Jibin;Li, Meng;Wang, Jianping;Wu, Jingang;Liu, Jinhua;Bu, Weihai;Wong, Waisum;Yu, Scott;Wu, Hanming;Lee, Shiuh-Wuu;Wang, Yangyuan |
| 2013 |
New observations on complex RTN in scaled high-��/metal-gate MOSFETs - The role of defect coupling under DC/AC condition |
Ren, Pengpeng;Hao, Peng;Liu, Changze;Wang, Runsheng;Jiang, Xiaobo;Qiu, Yingxin;Huang, Ru;Guo, Shaofeng;Luo, Mulong;Zou, Jibin;Li, Meng;Wang, Jianping;Wu, Jingang;Liu, Jinhua;Bu, Weihai;Wong, Waisum;Yu, Scott;Wu, Hanming;Lee, Shiuh-Wuu;Wang, Yangyuan |
| 2015 |
New understanding of state-loss in complex RTN: Statistical experimental study, trap interaction models, and impact on circuits |
Zou, Jibin;Wang, Runsheng;Guo, Shaofeng;Luo, Mulong;Yu, Zhuoqing;Jiang, Xiaobo;Ren, Pengpeng;Wang, Jianping;Liu, Jinhua;Wu, Jingang;Wong, Waisum;Yu, Shaofeng;Wu, Hanming;Lee, Shiuh-Wuu;Wang, Yangyuan;Huang, Ru |
| 2016 |
Too Noisy at the Nanoscale?-The Rise of Random Telegraph Noise (RTN) in Devices and Circuits |
Wang, Runsheng;Guo, Shaofeng;Ren, Pengpeng;Luo, Mulong;Zou, Jibin;Hang, Ru |
| 2013 |
A Unified Approach for Trap-Aware Device/Circuit Co-Design in Nanoscale CMOS Technology |
Wang, Runsheng;Luo, Mulong;Guo, Shaofeng;Huang, Ru;Liu, Changze;Zou, Jibin;Wang, Jianping;Wu, Jingang;Xu, Nuo;Wong, Waisum;Yu, Scott;Wu, Hanming;Lee, Shiuh-Wuu;Wang, Yangyuan |
