Browsing by Author Yu, Scott
Showing results 1 to 3 of 3
Issue Date |
Title |
Author(s) |
2015 |
DTMOS mode as an effective solution of RTN suppression for robust device/circuit co-design |
Guo, Shaofeng;Huang, Ru;Hao, Peng;Luo, Mulong;Ren, Pengpeng;Wang, Jianping;Bu, Weihai;Wu, Jingang;Wong, Waisum;Yu, Scott;Wu, Hanming;Lee, Shiuh-Wuu;Wang, Runsheng;Wang, Yangyuan |
2013 |
New observations on complex RTN in scaled high-��/metal-gate MOSFETs - The role of defect coupling under DC/AC condition |
Ren, Pengpeng;Hao, Peng;Liu, Changze;Wang, Runsheng;Jiang, Xiaobo;Qiu, Yingxin;Huang, Ru;Guo, Shaofeng;Luo, Mulong;Zou, Jibin;Li, Meng;Wang, Jianping;Wu, Jingang;Liu, Jinhua;Bu, Weihai;Wong, Waisum;Yu, Scott;Wu, Hanming;Lee, Shiuh-Wuu;Wang, Yangyuan |
2013 |
A Unified Approach for Trap-Aware Device/Circuit Co-Design in Nanoscale CMOS Technology |
Wang, Runsheng;Luo, Mulong;Guo, Shaofeng;Huang, Ru;Liu, Changze;Zou, Jibin;Wang, Jianping;Wu, Jingang;Xu, Nuo;Wong, Waisum;Yu, Scott;Wu, Hanming;Lee, Shiuh-Wuu;Wang, Yangyuan |