| Issue Date |
Title |
Author(s) |
| 2017 |
Characterization and Analysis of Diode-String ESD Protection in 28nm CMOS by VFTLP |
Li, Cheng;Wang, Chenkun;Chen, Qi;Zhang, Feilong;Lu, Fei;Shi, Xuejie;Yang, Yongsheng;Li, Hongwei;Chen, Guang;Li, Tony;Feng, Danniel;Tang, Tianshen;Cheng, Yuhua;Wang, Albert |
| 2018 |
Characterization of single-crystalline graphene ESD interconnects |
Chen, Qi;Li, Cheng;Lu, Fei;Wang, Chenkun;Zhang, Feilong;Wu, Tianru;Xie, Xiaoming;Zhang, Kun;Li, Xinxin;Ng, Jimmy;Xie, Ya-Hong;Cheng, Yuhua;Wang, Albert |
| 2017 |
Characterization of Single-Crystalline Graphene ESD Interconnects |
Chen, Qi;Li, Cheng;Lu, Fei;Wang, Chenkun;Zhang, Feilong;Wu, Tianru;Xie, Xiaoming;Zhang, Kun;Li, Xinxin;Ng, Jimmy;Xie, Ya-Hong;Cheng, Yuhua;Wang, Albert |
| 2017 |
Circuit-Level ESD Protection Simulation Using Behavior Models in 28nm CMOS |
Zhang, Feilong;Wang, Chenkun;Lu, Fei;Chen, Qi;Li, Cheng;Wang, Albert;Li, Daguang;Yu, Shaofeng;Zhu, Chengyu;Tang, Tianshen;Cheng, Yuhua |
| 2017 |
A Comparison Study of DTSCR by TCAD and VFTLP for CDM ESD Protection |
Wang, Chenkun;Zhang, Feilong;Lu, Fei;Chen, Qi;Li, Cheng;Zhao, Meng;Gu, Huihui;Feng, Guangtao;Wu, Hongying;Tang, Tianshen;Cheng, Yuhua;Wang, Albert |
| 2016 |
A Systematic Study of ESD Protection Co-Design With High-Speed and High-Frequency ICs in 28 nm CMOS |
Lu, Fei;Ma, Rui;Dong, Zongyu;Wang, Li;Zhang, Chen;Wang, Chenkun;Chen, Qi;Wang, X. Shawn;Zhang, Feilong;Li, Cheng;Tang, He;Cheng, Yuhua;Wang, Albert |
| 2016 |
Systematic Transient Characterization of Graphene Interconnects for on-Chip ESD Protection |
Chen, Qi;Ma, Rui;Lu, Fei;Wang, Chenkun;Liu, Ming;Wang, Albert;Zhang, Wei;Xia, Ming;Xie, Ya-Hong;Cheng, Yuhua |
| 2018 |
Temperature Dependence of Diode and ggNMOS ESD Protection Structures in 28nm CMOS |
Li, Cheng;Zhang, Feilong;Wang, Chenkun;ChenQi;Lu, Fei;Wang, Han;Di, Mengfu;Cheng, Yuhua;Zhao, Haijun;Wang, Albert |
