Issue Date |
Title |
Author(s) |
2012 |
Design and analysis of new silicided nano crystal dots field programmable ESD protection structures in BiCMOS |
Ma, Rui;Shi, Zitao;Wang, Xin;Liu, Jian;Zhao, Hui;Wang, Li;Dong, Zongyu;Zhang, Chen;Lin, Lin;Zhou, Huimei;Wang, Albert;Liu, Jianlin;Zhao, Bin;Cheng, Yuhua |
2013 |
Heterogeneous integration of nano enabling devices for 3D ICs |
Wang, Li;Ma, Rui;Zhang, Chen;Dong, Zongyu;Wang, Xin;Shi, Zitao;Liu, Jian;Lin, Lin;Zhao, Hui;Lu, Fei;Fang, Qiang;Yang, Chen;Zhan, Jing;Ren, Tianling;Li, Xinxin;Huang, Ru;Wang, Albert |
2013 |
Nano enabled 3D integration of on-chip ESD protection for ICs |
Wang, Li;Zhang, Chen;Dong, Zongyu;Ma, Rui;Wang, Xin;Shi, Zitao;Zhao, Hui;Liu, Jian;Lu, Fei;Wang, Albert;Cheng, Yuhua |
2013 |
Post-Si Programmable ESD Protection Circuit Design: Mechanisms and Analysis |
Wang, Xin;Shi, Zitao;Liu, Jian;Lin, Lin;Zhao, Hui;Wang, Li;Ma, Rui;Zhang, Chen;Dong, Zongyu;Fan, Siqiang;Tang, He;Wang, Albert;Cheng, Yuhua;Zhao, Bin;Zhang, Zhigang;Chi, Baoyong;Ren, Tian-Ling |
2013 |
Post-si programmable ESD protection circuit design: Mechanisms and analysis |
Wang, Xin;Shi, Zitao;Liu, Jian;Lin, Lin;Zhao, Hui;Wang, Li;Ma, Rui;Zhang, Chen;Dong, Zongyu;Fan, Siqiang;Tang, He;Wang, Albert;Cheng, Yuhua;Zhao, Bin;Zhang, Zhigang;Chi, Baoyong;Ren, Tian-Ling |
2013 |
Scalable behavior modeling for nano crossbar ESD protection structures by Verilog-A |
Wang, Li;Wang, Xin;Shi, Zitao;Ma, Rui;Liu, Jian;Dong, Zongyu;Zhang, Chen;Lu, Fei;Lin, Lui;Zhao, Hui;Wang, Albert;Cheng, Yuhua |
2016 |
A Systematic Study of ESD Protection Co-Design With High-Speed and High-Frequency ICs in 28 nm CMOS |
Lu, Fei;Ma, Rui;Dong, Zongyu;Wang, Li;Zhang, Chen;Wang, Chenkun;Chen, Qi;Wang, X. Shawn;Zhang, Feilong;Li, Cheng;Tang, He;Cheng, Yuhua;Wang, Albert |