Browsing by Author Sun, Yongsheng
Showing results 1 to 1 of 1
Issue Date |
Title |
Author(s) |
2018 |
New insights into the HCI degradation of pass-gate transistor in advanced FinFET technology |
Ren, Pengpeng;Liu, Changze;Wan, Sanping;Zhang, Jiayang;Yu, Zhuoqing;Liu, Nie;Sun, Yongsheng;Wang, Runsheng;Zhan, Canhui;Gan, Zhenghao;Wong, Waisum;Xia, Yu;Huang, Ru |