| Issue Date | Title | Author(s) |
| 2008 | Characteristics and fluctuation of negative bias temperature instability in Si nanowire field-effect transistors | Wang, Runsheng; Huang, Ru; He, Yandong; Wang, Zhenhua; Jia, Gaosheng; Kim, Dong-Won; Park, Donggun; Wang, Yangyuan |
| 2009 | Experimental Investigation and Design Optimization Guidelines of Characteristic Variability in Silicon Nanowire CMOS Technology | Zhuge, Jing; Wang, Runsheng; Huang, Ru; Zou, Jibin; Huang, Xin; Kim, D.W.; Park, Donggun; Zhang, Xing; Wang, Yangyuan |
| 2008 | Experimental Investigations on Carrier Transport in Si Nanowire Transistors: Ballistic Efficiency and Apparent Mobility | Wang, Runsheng; Liu, Hongwei; Huang, Ru; Zhuge, Jing; Zhang, Liangliang; Kim, Dong-Won; Zhang, Xing; Park, Donggun; Wang, Yangyuan |
| 2008 | Experimental investigations on channel backscattering characteristics of gate-all-around silicon nanowire transistors from top-down approach | Wang, Runsheng; Huang, Ru; Zhang, Liangliang; Liu, Hongwei; Kim, Dong-Won; Park, Donggun; Wang, Yangyuan |
| 2008 | An Experimental Study on Carrier Transport in Silicon Nanowire Transistors: How Close to the Ballistic Limit? | Wang, Runsheng; Jing Zhuge; Huang, Ru; Zhang, Liangliang; Kim, Dong-Won; Zhang, Xing; Park, Donggun; Wang, Yangyuan |
| 2008 | Experimental Study on Quasi-Ballistic Transport in Silicon Nanowire Transistors and the Impact of Self-Heating Effects | Wang, Runsheng; Zhuge, Jing; Liu, Changze; Huang, Ru; Kim, D.W.; Park, Donggun; Wang, Yangyuan |
| 2008 | Impacts of Non-negligible Electron Trapping/Detrapping on the NBTI Characteristics in Silicon Nanowire Transistors with TiN Metal Gates | Zhang, Liangliang; Wang, Runsheng; Zhuge, Jing; Huang, Ru; Kim, Dong-Won; Park, Donggun; Wang, Yangyuan |
| 2007 | Investigation of analog/RF performance and reliability behavior of silicon nanowire MOSFETs (invited) | Huang, Ru; Wang, Runsheng; Zhuge, Jing; Tian, Yu; Wang, Zhenhua; Kim, Dong-Won; Park, Donggun; Wang, Yangyuan |
| 2009 | Investigation of Low-Frequency Noise in Silicon Nanowire MOSFETs | Zhuge, Jing; Wang, Runsheng; Huang, Ru; Tian, Yu; Zhang, Liangliang; Kim, Dong-Won; Park, Donggun; Wang, Yangyuan |
| 2009 | Investigation on Self-Heating Effect in Gate-All-Around Silicon Nanowire MOSFETs From Top-Down Approach | Wang, Runsheng; Zhuge, Jing; Huang, Ru; Kim, Dong-Won; Park, Donggun; Wang, Yangyuan |
| 2011 | Investigation on Variability in Metal-Gate Si Nanowire MOSFETs: Analysis of Variation Sources and Experimental Characterization | Wang, Runsheng; Jing Zhuge; Huang, Ru; Yu, Tao; Zou, Jibin; Kim, Dong-Won; Park, Donggun; Wang, Yangyuan |
| 2010 | Negative-Bias Temperature Instability in Gate-All-Around Silicon Nanowire MOSFETs: Characteristic Modeling and the Impact on Circuit Aging | Liu, Changze; Yu, Tao; Wang, Runsheng; Zhang, Liangliang; Huang, Ru; Kim, Dong-Won; Park, Donggun; Wang, Yangyuan |
| 2009 | New Insights into Oxide Traps Characterization in Gate-All-Around Nanowire Transistors with TiN Metal Gates Based on Combined I(g)-I(d) RTS Technique | Zhang, Liangliang; Zhuge, Jing; Wang, Runsheng; Huang, Ru; Liu, Changze; Wu, Dake; Kang, Zhaoyi; Kim, Done-Won; Park, Donggun; Wang, Yangyuan |
| 2009 | New insights into oxide traps characterization in gate-all-around nanowire transistors with TiN metal gates based on combined Ig-Id RTS technique | Zhang, Liangliang; Zhuge, Jing; Wang, Runsheng; Huang, Ru; Liu, Changze; Wu, Dake; Kang, Zhaoyi; Kim, Dong-Won; Park, Donggun; Wang, Yangyuan |
| 2007 | New observations on the hot carrier and NBTI reliability of silicon nanowire transistors | Wang, Runsheng; Huang, Ru; Kim, Dong-Won; He, Yandong; Wang, Zhenhua; Jia, Gaosheng; Park, Donggun; Wang, Yangyuan |
| 2009 | Random telegraph signal noise in gate-all-around silicon nanowire transistors featuring Coulomb-blockade characteristics | Zhuge, Jing; Zhang, Liangliang; Wang, Runsheng; Huang, Ru; Kim, Dong-Won; Park, Donggun; Wang, Yangyuan |
| 2008 | Study of Low Frequency Noise Behavior in Silicon Nanowire Transistors Fabricated with Top-to-Down Approach | Zhuge, Jing; Huang, Ru; Wang, Runsheng; Zhangi, Liangliang; Kim, D.W.; Park, Donggun; Wang, Yangyuan |
