Browsing by Author Zhuge, Jing

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Issue Date Title Author(s)
2007 Analog/RF performance of Si nanowire MOSFETs and the impact of process variation Wang, Runsheng;Zhuge, Jing;Huang, Ru;Tian, Yu;Xiao, Han;Zhang, Liangliang;Li, Chen;Zhang, Xing;Wang, Yangyuan
2010 Characteristics of Gate Current Random Telegraph Signal Noise in SiON/HfO2/TaN p-Type Metal-Oxide-Semiconductor Field-Effect Transistors under Negative Bias Temperature Instability Stress Condition Zhang, Liangliang;Liu, Changze;Wang, Runsheng;Huang, Ru;Yu, Tao;Zhuge, Jing;Kirsch, Paul;Tseng, Hsing-Huang;Wang, Yangyuan
2010 Characteristics of gate current random telegraph signal noise in SiON/HfO2/TaN p-type metal-oxide-semiconductor field-effect transistors under negative bias temperature instability stress condition Zhang, Liangliang;Liu, Changze;Wang, Runsheng;Huang, Ru;Yu, Tao;Zhuge, Jing;Kirsch, Paul;Tseng, Hsing-Huang;Wang, Yangyuan
2011 Characterization and Analysis of Gate-All-Around Si Nanowire Transistors for Extreme Scaling Huang, Ru;Wang, Runsheng;Zhuge, Jing;Liu, Changze;Yu, Tao;Zhang, Liangliang;Huang, Xin;Ai, Yujie;Zou, Jinbin;Liu, Yuchao;Fan, Jiewen;Liao, Huailin;Wang, Yangyuan
2008 A comparative study on analog/RF performance of UTB GOI and SOI devices Zhuge, Jing;An, Xia;Huang, Ru;Xiao, Han;Hou, Xiaoyu;Wang, Runsheng;Wang, Yangyuan
2012 Design Optimization for Digital Circuits Built With Gate-All-Around Silicon Nanowire Transistors Liu, Yuchao;Huang, Ru;Wang, Runsheng;Zhuge, Jing;Xu, Qiumin;Wang, Yangyuan
2011 Experimental Demonstration of Current Mirrors Based on Silicon Nanowire Transistors for Inversion and Subthreshold Operations Huang, Ru;Zou, Jibin;Wang, Runsheng;Fan, Chunhui;Ai, Yujie;Zhuge, Jing;Wang, Yangyuan
2009 Experimental Investigation and Design Optimization Guidelines of Characteristic Variability in Silicon Nanowire CMOS Technology Zhuge, Jing;Wang, Runsheng;Huang, Ru;Zou, Jibin;Huang, Xin;Kim, D.W.;Park, Donggun;Zhang, Xing;Wang, Yangyuan
2008 Experimental Investigations on Carrier Transport in Si Nanowire Transistors: Ballistic Efficiency and Apparent Mobility Wang, Runsheng;Liu, Hongwei;Huang, Ru;Zhuge, Jing;Zhang, Liangliang;Kim, Dong-Won;Zhang, Xing;Park, Donggun;Wang, Yangyuan
2008 Experimental Study on Quasi-Ballistic Transport in Silicon Nanowire Transistors and the Impact of Self-Heating Effects Wang, Runsheng;Zhuge, Jing;Liu, Changze;Huang, Ru;Kim, D.W.;Park, Donggun;Wang, Yangyuan
2009 Fabrication and transport behavior investigation of gate-all-around silicon nanowire transistor from top-down approach (invited) Huang, Ru;Wang, Runsheng;Tian, Yu;Zhuge, Jing;Zhang, Liangliang;Liu, Changze;Wang, Yiqun;Ai, Yujie;Wang, Yangyuan
2011 HCI and NBTI induced degradation in gate-all-around silicon nanowire transistors Huang, Ru;Wang, Runsheng;Liu, Changze;Zhang, Liangliang;Zhuge, Jing;Tao, Yu;Zou, Jibin;Liu, Yuchao;Wang, Yangyuan
2011 HCI and NBTI induced degradation in gate-all-around silicon nanowire transistors Huang, Ru;Wang, Runsheng;Liu, Changze;Zhang, Liangliang;Zhuge, Jing;Tao, Yu;Zou, Jibin;Liu, Yuchao;Wang, Yangyuan
2010 High-Performance Si Nanowire Transistors on Fully Si Bulk Substrate From Top-Down Approach: Simulation and Fabrication Zhuge, Jing;Tian, Yu;Wang, Runsheng;Huang, Ru;Wang, Yiqun;Chen, Baoqin;Liu, Jia;Zhang, Xing;Wang, Yangyuan
2008 Impacts of Non-negligible Electron Trapping/Detrapping on the NBTI Characteristics in Silicon Nanowire Transistors with TiN Metal Gates Zhang, Liangliang;Wang, Runsheng;Zhuge, Jing;Huang, Ru;Kim, Dong-Won;Park, Donggun;Wang, Yangyuan
2007 Investigation of analog/RF performance and reliability behavior of silicon nanowire MOSFETs (invited) Huang, Ru;Wang, Runsheng;Zhuge, Jing;Tian, Yu;Wang, Zhenhua;Kim, Dong-Won;Park, Donggun;Wang, Yangyuan
2010 Investigation of Different Strain Configurations in Gate-All-Around Silicon Nanowire Transistor Yun, Quanxin;Zhuge, Jing;Huang, Ru;Wang, Runsheng;An, Xia;Zhang, Liangliang;Zhang, Xing;Wang, Yangyuan
2009 Investigation of Low-Frequency Noise in Silicon Nanowire MOSFETs Zhuge, Jing;Wang, Runsheng;Huang, Ru;Tian, Yu;Zhang, Liangliang;Kim, Dong-Won;Park, Donggun;Wang, Yangyuan
2010 Investigation of Nanowire Line-Edge Roughness in Gate-All-Around Silicon Nanowire MOSFETs Yu, Tao;Wang, Runsheng;Huang, Ru;Chen, Jiang;Zhuge, Jing;Wang, Yangyuan
2008 Investigation of parasitic effects and design optimization in silicon nanowire MOSFETs for RF applications Zhuge, Jing;Wang, Runsheng;Huang, Ru;Zhang, Xing;Wang, Yangyuan
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