| Issue Date |
Title |
Author(s) |
| 2018 |
Analyzing Electric Field Effect by Applying an Ultra-Short Time Pulse Condition in Hafnium Oxide-Based RRAM |
Wu, Cheng-Hsien;Lin, Shih-Kai;Pan, Chih-Hung;Chen, Po-Hsun;Lin, Wen-Yan;Chang, Ting-Chang;Tsai, Tsung-Ming;Xu, You-Lin;Shih, Chih-Cheng;Lin, Yu-Shuo;Chen, Wen-Chung;Wang, Ming-Hui;Zhang, Sheng-Dong;Sze, Simon M. |
| 2013 |
Characteristics of hafnium oxide resistance random access memory with different setting compliance current |
Su, Yu-Ting;Chang, Kuan-Chang;Chang, Ting-Chang;Tsai, Tsung-Ming;Zhang, Rui;Lou, J. C.;Chen, Jung-Hui;Young, Tai-Fa;Chen, Kai-Huang;Tseng, Bae-Heng;Shih, Chih-Cheng;Yang, Ya-Liang;Chen, Min-Chen;Chu, Tian-Jian;Pan, Chih-Hung;Syu, Yong-En;Sze, Simon M. |
| 2017 |
Conduction Mechanism and Improved Endurance in HfO2-Based RRAM with Nitridation Treatment |
Yuan, Fang-Yuan;Deng, Ning;Shih, Chih-Cheng;Tseng, Yi-Ting;Chang, Ting-Chang;Chang, Kuan-Chang;Wang, Ming-Hui;Chen, Wen-Chung;Zheng, Hao-Xuan;Wu, Huaqiang;Qian, He;Sze, Simon M. |
| 2014 |
Controllable Set Voltage in Bilayer ZnO:SiO2/ZnOx Resistance Random Access Memory by Oxygen Concentration Gradient Manipulation |
Huang, Xuan;Chang, Kuan-Chang;Chang, Ting-Chang;Tsai, Tsung-Ming;Shih, Chih-Cheng;Zhang, Rui;Huang, Syuan-Yong;Chen, Kai-Huang;Chen, Jung-Hui;Wang, Huei-Jruan;Chen, Wen-Jen;Zhang, Fengyan;Chen, Chao;Sze, Simon M. |
| 2017 |
Effects of plasma treatment time on surface characteristics of indium-tin-oxide film for resistive switching storage applications |
Chen, Po-Hsun;Chang, Ting-Chang;Chang, Kuan-Chang;Tsai, Tsung-Ming;Pan, Chih-Hung;Shih, Chih-Cheng;Wu, Cheng-Hsien;Yang, Chih-Cheng;Chen, Wen-Chung;Lin, Jiun-Chiu;Wang, Ming-Hui;Zheng, Hao-Xuan;Chen, Min-Chen;Sze, Simon M. |
| 2013 |
Electrical conduction mechanism of Zn:SiOx resistance random access memory with supercritical CO2 fluid process |
Chang, Kuan-Chang;Tsai, Tsung-Ming;Zhang, Rui;Chang, Ting-Chang;Chen, Kai-Huang;Chen, Jung-Hui;Young, Tai-Fa;Lou, J. C.;Chu, Tian-Jian;Shih, Chih-Cheng;Pan, Jhih-Hong;Su, Yu-Ting;Syu, Yong-En;Tung, Cheng-Wei;Chen, Min-Chen;Wu, Jia-Jie;Hu, Ying;Sze, Simon M. |
| 2013 |
Endurance Improvement Technology With Nitrogen Implanted in the Interface of WSiOx Resistance Switching Device |
Syu, Yong-En;Zhang, Rui;Chang, Ting-Chang;Tsai, Tsung-Ming;Chang, Kuan-Chang;Lou, Jen-Chung;Young, Tai-Fa;Chen, Jung-Hui;Chen, Min-Chen;Yang, Ya-Liang;Shih, Chih-Cheng;Chu, Tian-Jian;Chen, Jian-Yu;Pan, Chih-Hung;Su, Yu-Ting;Huang, Hui-Chun;Gan, Der-Shin;Sze, Simon M. |
| 2018 |
Enhancing the Electrical Uniformity and Reliability of the HfO2-Based RRAM Using High- Permittivity Ta2O5 Side Wall |
Yuan, Mei;Tseng, Yi-Ting;Chen, Po-Hsun;Shih, Chih-Cheng;Huang, Hui-Chun;Chang, Ting-Chang;Cui, Xiaole;Lin, Xinnan;Zhang, Shengdong;Zhou, Hang |
| 2013 |
High performance of graphene oxide-doped silicon oxide-based resistance random access memory |
Zhang, Rui;Chang, Kuan-Chang;Chang, Ting-Chang;Tsai, Tsung-Ming;Chen, Kai-Huang;Lou, Jen-Chung;Chen, Jung-Hui;Young, Tai-Fa;Shih, Chih-Cheng;Yang, Ya-Liang;Pan, Yin-Chih;Chu, Tian-Jian;Huang, Syuan-Yong;Pan, Chih-Hung;Su, Yu-Ting;Syu, Yong-En;Sze, Simon M. |
| 2013 |
Hopping conduction distance dependent activation energy characteristics of Zn:SiO2 resistance random access memory devices |
Chen, Kai-Huang;Zhang, Rui;Chang, Ting-Chang;Tsai, Tsung-Ming;Chang, Kuan-Chang;Lou, J. C.;Young, Tai-Fa;Chen, Jung-Hui;Shih, Chih-Cheng;Tung, Cheng-Wei;Syu, Yong-En;Sze, Simon M. |
| 2013 |
Hopping Effect of Hydrogen-Doped Silicon Oxide Insert RRAM by Supercritical CO2 Fluid Treatment |
Chang, Kuan-Chang;Pan, Chih-Hung;Chang, Ting-Chang;Tsai, Tsung-Ming;Zhang, Rui;Lou, Jen-Chung;Young, Tai-Fa;Chen, Jung-Hui;Shih, Chih-Cheng;Chu, Tian-Jian;Chen, Jian-Yu;Su, Yu-Ting;Jiang, Jhao-Ping;Chen, Kai-Huang;Huang, Hui-Chun;Syu, Yong-En;Gan, Der-Shin;Sze, Simon M. |
| 2017 |
Inert Pt electrode switching mechanism after controlled polarity-forming process in In2O3-based resistive random access memory |
Wu, Cheng-Hsien;Pan, Chih-Hung;Chen, Po-Hsun;Chang, Ting-Chang;Tsai, Tsung-Ming;Chang, Kuan-Chang;Shih, Chih-Cheng;Chi, Ting-Yang;Chu, Tian-Jian;Wu, Jia-Ji;Du, Xiaoqin;Zheng, Hao-Xuan;Sze, Simon M. |
| 2013 |
Mechanism of power consumption inhibitive multi-layer Zn:SiO2/SiO2 structure resistance random access memory |
Zhang, Rui;Tsai, Tsung-Ming;Chang, Ting-Chang;Chang, Kuan-Chang;Chen, Kai-Huang;Lou, Jen-Chung;Young, Tai-Fa;Chen, Jung-Hui;Huang, Syuan-Yong;Chen, Min-Chen;Shih, Chih-Cheng;Chen, Hsin-Lu;Pan, Jhih-Hong;Tung, Cheng-Wei;Syu, Yong-En;Sze, Simon M. |
| 2013 |
Origin of Hopping Conduction in Graphene-Oxide-Doped Silicon Oxide Resistance Random Access Memory Devices |
Chang, Kuan-Chang;Zhang, Rui;Chang, Ting-Chang;Tsai, Tsung-Ming;Lou, J. C.;Chen, Jung-Hui;Young, Tai-Fa;Chen, Min-Chen;Yang, Ya-Liang;Pan, Yin-Chih;Chang, Geng-Wei;Chu, Tian-Jian;Shih, Chih-Cheng;Chen, Jian-Yu;Pan, Chih-Hung;Su, Yu-Ting;Syu, Yong-En;Tai, Ya-Hsiang;Sze, Simon M. |
| 2013 |
Performance and characteristics of double layer porous silicon oxide resistance random access memory |
Tsai, Tsung-Ming;Chang, Kuan-Chang;Zhang, Rui;Chang, Ting-Chang;Lou, J. C.;Chen, Jung-Hui;Young, Tai-Fa;Tseng, Bae-Heng;Shih, Chih-Cheng;Pan, Yin-Chih;Chen, Min-Chen;Pan, Jhih-Hong;Syu, Yong-En;Sze, Simon M. |
| 2014 |
Resistive Switching Modification by Ultraviolet Illumination in Transparent Electrode Resistive Random Access Memory |
Shih, Chih-Cheng;Chang, Kuan-Chang;Chang, Ting-Chang;Tsai, Tsung-Ming;Zhang, Rui;Chen, Jung-Hui;Chen, Kai-Huang;Young, Tai-Fa;Chen, Hsin-Lu;Lou, Jen-Chung;Chu, Tian-Jian;Huang, Syuan-Yong;Bao, Ding-Hua;Sze, Simon M. |
| 2017 |
Role of H2O Molecules in Passivation Layer of a-InGaZnO Thin Film Transistors |
Chien, Yu-Chieh;Chang, Ting-Chang;Chiang, Hsiao-Cheng;Chen, Hua-Mao;Tsao, Yu-Ching;Shih, Chih-Cheng;Chen, Bo-Wei;Liao, Po-Yung;Chu, Ting-Yang;Yang, Yi-Chieh;Hung, Yu-Ju;Tsai, Tsung-Ming;Chang, Kuan-Chang |
| 2017 |
Solving the Scaling Issue of Increasing Forming Voltage in Resistive Random Access Memory Using High-k Spacer Structure |
Tseng, Yi-Ting;Chen, Po-Hsun;Chang, Ting-Chang;Chang, Kuan-Chang;Tsai, Tsung-Ming;Shih, Chih-Cheng;Huang, Hui-Chun;Yang, Cheng-Chi;Lin, Chih-Yang;Wu, Cheng-Hsien;Zheng, Hao-Xuan;Zhang, Shengdong;Sze, Simon M. |
| 2014 |
Ultra-violet light enhanced super critical fluid treatment in In-Ga-Zn-O thin film transistor |
Chen, Hsin-lu;Chang, Ting-Chang;Young, Tai-Fa;Tsai, Tsung-Ming;Chang, Kuan-Chang;Zhang, Rui;Huang, Sheng-Yao;Chen, Kai-Huang;Lou, J. C.;Chen, Min-Chen;Shih, Chih-Cheng;Huang, Syuan-Yong;Chen, Jung-Hui |
