Browsing by Author Wang, Yang-Yuan

Jump to: 0-9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
Showing results 1 to 20 of 22 next >
Issue Date Title Author(s)
2001 2-dimensional analysis of surface electric field profile of planar junction with single-step field-plate termination structure He, Jin;Zhang, Xing;Huang, Ru;Wang, Yang-Yuan
1985 CHARACTERISTICS AND MORPHOLOGY OF OXIDATION OF POLYCRYSTALLINE SILICON FILMS IN VLSI. Wang, Yang-Yuan;Zhang, Ai-Zhen
2002 Closed-form high frequency noise model for short channel SOI MOSFETS Zhang, Guo-Yan;Liao, Huai-Lin;Huang, Ru;Mansun, Chan;Zhang, Xing;Wang, Yang-Yuan
2001 Direct extraction method for the parameters of temperature noise model Liao, Huai-Lin;Huang, Ru;Zhang, Xing;Wang, Yang-Yuan
2002 Distortion analysis of SOI MOSFET for mixed mode integrated circuit application Zhang, Guo-Yan;Liao, Huai-Lin;Huang, Ru;Chan, Mansun;Zhang, Xing;Wang, Yang-Yuan
2001 Electrical characteristics of 3-6nm ultra-thin gate oxide Gao, Wen-Yu;Zhang, Xing;Tian, Da-Yu;Zhang, Da-Cheng;Wang, Yang-Yuan
2002 Hot carrier-induced interface traps in N-channel MOSFET/SOI characterized by a forward gated-diode technique He, Jin;Zhang, Xing;Huang, Ru;Wang, Yang-Yuan
2007 A low-voltage and low-power CMOS LNA using forward-body-bias NMOS at 5GHz Wu, Da-Ke;Huang, Ru;Wang, Yang-Yuan
2001 New quasi two-dimensional analytical approach to predicting ring junction voltage, edge peak fields and optimal spacing of planar junction with single floating field limiting ring structure He, Jin;Zhang, Xing;Huang, Ru;Wang, Yang-Yuan
2001 New threshold voltage shift model due to radiation in fully-depleted SOI MOSFET Wan, Xin-Heng;Zhang, Xing;Tan, Jing-Rong;Gao, Wen-Yu;Huang, Ru;Wang, Yang-Yuan
2001 Normalized mutual integral difference operator: A novel experimental method for extracting threshold voltage of MOSFETs He, Jin;Zhang, Xing;Huang, Ru;Wang, Yang-Yuan
2001 Novel analytical model for surface electric field distribution and optimization of TFSOI RESURF devices He, Jin;Zhang, Xing;Huang, Ru;Wang, Yang-Yuan
2006 On line measurement of maximal torsional strength of micro level structure Ruan, Yong;Huan, Yong;Zhang, Da-Cheng;Zhang, Tai-Hua;Wang, Yang-Yuan
2011 Optimisation design for EEPROM embedded in UHF-RFID passive transponders Li, Ming;Yang, Li-Wu;Kang, Jin-Feng;Wang, Yang-Yuan
2001 Phenomenological MOSFET model including total dose radiation effects at a high total dose Wan, Xin-Heng;Zhang, Xing;Gao, Wen-Yu;Huang, Ru;Wang, Yang-Yuan
2001 Sensitivity analysis of the back interface trap-induced R-G current obtained by a lateral SOI forward gated-diode He, Jin;Zhang, Xing;Huang, Ru;Huang, Ai-Hua;Lu, Zhen-Ting;Wang, Yang-Yuan;Nguyen, Bich-Yen;Foisy, Mark;Zhang, Yao-Hui;Yu, Shan;Jia, Lin
2001 Short-channel SOI MOSFET model considering total dose effects Wan, Xin-Heng;Gan, Xue-Wen;Zhang, Xing;Huang, Ru;Wang, Yang-Yuan
2002 Study of silicon-based MEMS technology and its standard process Wang, Yang-Yuan;Wu, Guo-Ying;Hao, Yi-Long;Zhang, Da-Cheng;Xiao, Zhi-Xiong;Li, Ting;Zhang, Guo-Bing;Zhang, Jin-Wen
2002 Study on extraction of stress-induced interface traps in MOSFETs by linear cofactor difference subthreshold voltage peak technique He, Jin;Zhang, Xing;Huang, Ru;Wang, Yang-Yuan
2006 Study on the impact of germanium preamorphization on the work function of fully silicided NiSi gate Cai, Yi-Mao;Huang, Ru;Shan, Xiao-Nan;Zhou, Fa-Long;Wang, Yang-Yuan
Showing results 1 to 20 of 22 next >