Browsing by Author Huang, Ai-Hua
Showing results 1 to 3 of 3
Issue Date | Title | Author(s) |
2001 | Channel lateral pocket or halo region of NMOSFET characterized by interface state R-G current of the forward gated-diode | He, Jin; Huang, Ai-Hua; Zhang, Xing; Huang, Ru |
2001 | Forward gated-diode monitoring of F-N stressing-Induced interface traps of NMOSFET/SOI | He, Jin; Huang, Ai-Hua; Zhang, Xing; Huang, Ru |
2001 | Sensitivity analysis of the back interface trap-induced R-G current obtained by a lateral SOI forward gated-diode | He, Jin; Zhang, Xing; Huang, Ru; Huang, Ai-Hua; Lu, Zhen-Ting; Wang, Yang-Yuan; Nguyen, Bich-Yen; Foisy, Mark; Zhang, Yao-Hui; Yu, Shan; Jia, Lin |