Browsing by Author Wu, Weikang
Showing results 1 to 8 of 8
| Issue Date |
Title |
Author(s) |
| 2015 |
Impact of heavy ion irradiation on CMOS current mirrors based on SOI and bulk Si substrates: mismatch and output impedance |
Wu, Weikang;An, Xia;Tan, Fei;Chen, Yehua;Liu, Jingjing;Zhang, Yao;Zhang, Xing;Shen, Dongjun;Guo, Gang;Huang, Ru |
| 2015 |
Impact of heavy ion irradiation on CMOS current mirrors based on SOI and bulk Si substrates: mismatch and output impedance |
Wu, Weikang;An, Xia;Tan, Fei;Chen, Yehua;Liu, Jingjing;Zhang, Yao;Zhang, Xing;Shen, Dongjun;Guo, Gang;Huang, Ru |
| 2019 |
The impact of heavy ion irradiation on the performance of novel REDI LDMOS power devices |
Ren, Zhexuan;An, Xia;Wu, Weikang;Zhang, Xing;Huang, Ru |
| 2016 |
Investigation of a radiation-hardened quasi-SOI device: performance degradation induced by single ion irradiation |
Wu, Weikang;An, Xia;Que, Taotao;Zhang, Xing;Shen, Dongjun;Guo, Gang;Huang, Ru |
| 2013 |
Investigation on the Response of TaOx-based Resistive Random-Access Memories to Heavy-Ion Irradiation |
Tan, Fei;Huang, Ru;An, Xia;Cai, Yimao;Pan, Yue;Wu, Weikang;Feng, Hui;Zhang, Xing;Wang, YangYuan |
| 2014 |
Investigation on TID tolerance of 65nm bulk silicon nMOSFETs |
Chen, Yehua;An, Xia;Wu, Weikang;Yao, Zhibin;Zhang, Xing;Huang, Ru |
| 2014 |
Total ionizing dose (TID) effect and single event effect (SEE) in quasi-SOI nMOSFETs |
Tan, Fei;Huang, Ru;An, Xia;Wu, Weikang;Feng, Hui;Huang, Liangxi;Fan, Jiewen;Zhang, Xing;Wang, Yangyuan |
| 2013 |
Total ionizing dose and single-event effect in vertical channel double-gate nMOSFETs |
Tan, Fei;An, Xia;Xue, Shoubin;Huang, Liangxi;Wu, Weikang;Zhang, Xing;Huang, Ru |
