Title High-Performance Carbon Nanotube-Based Transient Complementary Electronics
Authors Xia, Fan
Xia, Tian
Xiang, Li
Liu, Fang
Jia, Weijie
Liang, Xuelei
Hu, Youfan
Affiliation Peking Univ, Key Lab Phys & Chem Nanodevices, Ctr Carbon Based Elect, Beijing 100871, Peoples R China
Peking Univ, Sch Elect, Beijing 100871, Peoples R China
Peking Univ, Acad Adv Interdisciplinary Studies, Beijing 100871, Peoples R China
Hunan Univ, Coll Mat & Engn, Changsha 410082, Peoples R China
Keywords TRANSISTORS
Issue Date 16-Mar-2022
Publisher ACS APPLIED MATERIALS & INTERFACES
Abstract Transient electronics is an emerging class of electronic devices that can physically degrade or disintegrate after a stable period of service, showing a vast prospect in applications of "green" consumer electronics, hardware-secure devices, medical implants, etc. Complementary metal-oxide-semiconductor (CMOS) technology is dominant in integrated circuit design for its advantages of low static power consumption, high noise immunity, and simple design layout, which also work and are highly preferred for transient electronics. However, the performance of complementary transient electronics is severely restricted by the confined selection of transient materials and compatible fabrication strategies. Here, we report the realization of high-performance transient complementary electronics based on carbon nanotube thin films via a reliable electrostatic doping method. Under a low operating voltage of 2 V, on a 1.5 mu m-thick water-soluble substrate made of poly(vinyl alcohol), the width-normalized on-state currents of the p-type and n-type transient thin-film transistors (TFTs) reach 4.5 and 4.7 mu A/mu m, and the width-normalized transconductances reach 2.8 and 3.7 mu S/mu m, respectively. Meanwhile, these TFTs show small subthreshold swings no more than 108 mV/dec and current on/off ratios above 106 with good uniformity. Transient CMOS inverters, as basic circuit components, are demonstrated with a voltage gain of 24 and a high noise immunity of 67.4%. Finally, both the degradation of the active components and the disintegration of the functional system are continuously monitored with nontraceable remains after 10 and 5 h, respectively.
URI http://hdl.handle.net/20.500.11897/642653
ISSN 1944-8244
DOI 10.1021/acsami.1c23134
Indexed EI
SCI(E)
Appears in Collections: 纳米器件物理与化学教育部重点实验室
前沿交叉学科研究院

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