Title Theoretical calculation boosting the chemical vapor deposition growth of graphene film
Authors Cheng, Ting
Sun, Luzhao
Liu, Zhirong
Ding, Feng
Liu, Zhongfan
Affiliation Peking Univ, Coll Chem & Mol Engn, Beijing Natl Lab Mol Sci,Ctr Nanochem, Acad Adv Interdisciplinary Studies,Beijing Sci &, Beijing 100871, Peoples R China
Beijing Graphene Inst BGI, Beijing 100095, Peoples R China
Inst Basic Sci, CtreMultidimens Carbon Mat, Ulsan, South Korea
Ulsan Natl Inst Sci & Technol, Sch Mat Sci & Engn, Ulsan, South Korea
Keywords SINGLE-CRYSTAL GRAPHENE
TWISTED BILAYER GRAPHENE
KINETIC MONTE-CARLO
GAS-PHASE DYNAMICS
MOLECULAR-DYNAMICS
CARRIER MOBILITY
SURFACE
IMPLEMENTATION
APPROXIMATION
ORIENTATION
Issue Date 1-Jun-2021
Publisher APL MATERIALS
Abstract Chemical vapor deposition (CVD) is a promising method for the mass production of high-quality graphene films, and great progress has been made over the last decade. Currently, the CVD growth of graphene is being pushed to achieve further advancements, such as super-clean, ultra-flat, and defect-free materials, as well as controlling the layer, stacking order, and doping level during large-scale preparation. The production of high-quality graphene by CVD relies on an in-depth knowledge of the growth mechanisms, in which theoretical calculations play a crucial role in providing valuable insights into the energy-, time-, and scale-dependent processes occurring during high-temperature growth. Here, we focus on the theoretical calculations and discuss the recent progress and challenges that need to be overcome to achieve controllable growth of high-quality graphene films on transition-metal substrates. Furthermore, we present some state-of-the-art graphene-related structures with novel properties, which are expected to enable new applications of graphene-based materials. (c) 2021 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).
URI http://hdl.handle.net/20.500.11897/624307
ISSN 2166-532X
DOI 10.1063/5.0051847
Indexed SCI(E)
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