| Title | Structured illumination microscopy artefacts caused by illumination scattering |
| Authors | Mo, Yanquan Feng, Fan Mao, Heng Fan, Junchao Chen, Liangyi |
| Affiliation | Peking Univ, Sch Future Technol, Inst Mol Med, State Key Lab Membrane Biol,Beijing Key Lab Cardi, Beijing 100871, Peoples R China Peking Univ, Ctr Bioinformat, Sch Life Sci, Natl Lab Prot Engn & Plant Genet Engn, Beijing 100871, Peoples R China Peking Univ, Sch Math Sci, Beijing 100871, Peoples R China Chongqing Univ Posts & Telecommun, Coll Comp Sci & Technol, Chongqing Key Lab Image Cognit, Chongqing 400065, Peoples R China PKU IDG McGovern Inst Brain Res, Beijing 100871, Peoples R China Beijing Acad Artificial Intelligence, Beijing 100871, Peoples R China Shenzhen Bay Lab, Shenzhen 518055, Peoples R China |
| Keywords | IMAGE-RECONSTRUCTION RESOLUTION LIMIT ADAPTIVE OPTICS FLUORESCENCE OPTIMIZATION MODEL |
| Issue Date | 14-Jun-2021 |
| Publisher | PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES |
| Abstract | Despite its wide application in live-cell super-resolution (SR) imaging, structured illumination microscopy (SIM) suffers from aberrations caused by various sources. Although artefacts generated from inaccurate reconstruction parameter estimation and noise amplification can be minimized, aberrations due to the scattering of excitation light on samples have rarely been investigated. In this paper, by simulating multiple subcellular structure with the distinct refractive index from water, we study how different thicknesses of this subcellular structure scatter incident light on its optical path of SIM excitation. Because aberrant interference light aggravates with the increase in sample thickness, the reconstruction of the 2D-SIM SR image degraded with the change of focus along the axial axis. Therefore, this work may guide the future development of algorithms to suppress SIM artefacts caused by scattering in thick samples. This article is part of the Theo Murphy meeting issue 'Super-resolution structured illumination microscopy (part 1)'. |
| URI | http://hdl.handle.net/20.500.11897/613040 |
| ISSN | 1364-503X |
| DOI | 10.1098/rsta.2020.0153 |
| Indexed | EI SCI(E) |
| Appears in Collections: | 分子医学研究所 膜生物学国家重点实验室 生命科学学院 蛋白质与植物基因研究国家重点实验室 数学科学学院 |
