Title Anapole mediated giant photothermal nonlinearity in nanostructured silicon
Authors Zhang, Tianyue
Che, Ying
Chen, Kai
Xu, Jian
Xu, Yi
Wen, Te
Lu, Guowei
Liu, Xiaowei
Wang, Bin
Xu, Xiaoxuan
Duh, Yi-Shiou
Tang, Yu-Lung
Han, Jing
Cao, Yaoyu
Guan, Bai-Ou
Chu, Shi-Wei
Li, Xiangping
Affiliation Jinan Univ, Inst Photon Technol, Guangdong Prov Key Lab Opt Fiber Sensing & Commun, Guangzhou 510632, Peoples R China
Nankai Univ, Sch Phys, Key Lab Weak Light Nonlinear Photon, Minist Educ, Tianjin 300071, Peoples R China
Jinan Univ, Coll Informat Sci & Technol, Dept Elect Engn, Guangzhou 510632, Peoples R China
Peking Univ, Frontiers Sci Ctr Nanooptoelect, Sch Phys, State Key Lab Mesoscop Phys, Beijing 100871, Peoples R China
Natl Taiwan Univ, Dept Phys, 1,Sec 4,Roosevelt Rd, Taipei 10617, Taiwan
Natl Tsing Hua Univ, Brain Res Ctr, 101,Sec 2,Guangfu Rd, Hsinchu 30013, Taiwan
Keywords 3RD HARMONIC-GENERATION
AMORPHOUS-SILICON
OPTICAL FUNCTIONS
SCATTERING
ENHANCEMENT
RESONANCES
MODES
RAMAN
Issue Date 15-Jun-2020
Publisher NATURE COMMUNICATIONS
Abstract Featured with a plethora of electric and magnetic Mie resonances, high index dielectric nanostructures offer a versatile platform to concentrate light-matter interactions at the nanoscale. By integrating unique features of far-field scattering control and near-field concentration from radiationless anapole states, here, we demonstrate a giant photothermal nonlinearity in single subwavelength-sized silicon nanodisks. The nanoscale energy concentration and consequent near-field enhancements mediated by the anapole mode yield a reversible nonlinear scattering with a large modulation depth and a broad dynamic range, unveiling a record-high nonlinear index change up to 0.5 at mild incident light intensities on the order of MW/cm(2). The observed photothermal nonlinearity showcases three orders of magnitude enhancement compared with that of unstructured bulk silicon, as well as nearly one order of magnitude higher than that through the radiative electric dipolar mode. Such nonlinear scattering can empower distinctive point spread functions in confocal reflectance imaging, offering the potential for far-field localization of nanostructured Si with an accuracy approaching 40nm. Our findings shed new light on active silicon photonics based on optical anapoles.
URI http://hdl.handle.net/20.500.11897/591036
ISSN 2041-1723
DOI 10.1038/s41467-020-16845-x
Indexed SCI(E)
Appears in Collections: 物理学院
人工微结构和介观物理国家重点实验室

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