Title Improved Epitaxy of AlN Film for Deep-Ultraviolet Light-Emitting Diodes Enabled by Graphene
Authors Chen, Zhaolong
Liu, Zhiqiang
Wei, Tongbo
Yang, Shenyuan
Dou, Zhipeng
Wang, Yunyu
Ci, Haina
Chang, Hongliang
Qi, Yue
Yan, Jianchang
Wang, Junxi
Zhang, Yanfeng
Gao, Peng
Li, Jinmin
Liu, Zhongfan
Affiliation Chinese Acad Sci, Inst Semicond, State Key Lab Solid State Lighting, Beijing 100083, Peoples R China
Peking Univ, Coll Chem & Mol Engn, Beijing Sci & Engn Ctr Nanocarbons, Ctr Nanochem CNC, Beijing 100871, Peoples R China
Beijing Natl Lab Mol Sci, Beijing 100871, Peoples R China
Univ Chinese Acad Sci, Ctr Mat Sci & Optoelect Engn, Beijing 100049, Peoples R China
Univ Chinese Acad Sci, Sch Microelect, Beijing 101408, Peoples R China
Chinese Acad Sci, Inst Semicond, State Key Lab Superlatt & Microstruct, Beijing 100083, Peoples R China
Peking Univ, Sch Phys, Electron Microscopy Lab, Beijing 100871, Peoples R China
Peking Univ, Sch Phys, Int Ctr Quantum Mat, Beijing 100871, Peoples R China
Collaborat Innovat Ctr Quantum Matter, Beijing 100871, Peoples R China
BGI, Beijing 100095, Peoples R China
Keywords aluminum nitride
chemical vapor deposition
deep-ultraviolet light-emitting diodes
graphene
quasi-van der Waals epitaxy
Issue Date 2019
Publisher ADVANCED MATERIALS
Abstract The growth of single-crystal III-nitride films with a low stress and dislocation density is crucial for the semiconductor industry. In particular, AlN-derived deep-ultraviolet light-emitting diodes (DUV-LEDs) have important applications in microelectronic technologies and environmental sciences but are still limited by large lattice and thermal mismatches between the epilayer and substrate. Here, the quasi-van der Waals epitaxial (QvdWE) growth of high-quality AlN films on graphene/sapphire substrates is reported and their application in high-performance DUV-LEDs is demonstrated. Guided by density functional theory calculations, it is found that pyrrolic nitrogen in graphene introduced by a plasma treatment greatly facilitates the AlN nucleation and enables fast growth of a mirror-smooth single-crystal film in a very short time of approximate to 0.5 h (approximate to 50% decrease compared with the conventional process), thus leading to a largely reduced cost. Additionally, graphene effectively releases the biaxial stress (0.11 GPa) and reduces the dislocation density in the epilayer. The as-fabricated DUV-LED shows a low turn-on voltage, good reliability, and high output power. This study may provide a revolutionary technology for the epitaxial growth of AlN films and provide opportunities for scalable applications of graphene films.
URI http://hdl.handle.net/20.500.11897/547659
ISSN 0935-9648
DOI 10.1002/adma.201807345
Indexed SCI(E)
EI
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物理学院

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