| Title | Demonstration of a robust insertion loss measuring approach for low-loss silicon photonic devices |
| Authors | Yang, Fenghe Deng, Qingzhong Sun, Pengfei Bai, Bowen Zhou, Zhiping |
| Affiliation | Peking Univ, Sch Elect Engn & Comp Sci, State Key Lab Adv Opt Commun Syst & Networks, Beijing 100871, Peoples R China Peking Univ, Shenzhen Res Inst, Shenzhen 518057, Peoples R China Peking Univ, Minist Educ, Nanooptoelect Frontier Ctr, Beijing 100871, Peoples R China |
| Issue Date | 2019 |
| Publisher | OPTICS EXPRESS |
| Abstract | A robust optical insertion loss measuring approach based on a symmetrically coupled add-drop microring resonator is demonstrated on silicon-on-insulator platform. Utilizing resonant wavelengths and relative values of measured optical power, this approach frees the insertion loss measurement from the uncertainties caused by experimental set-up, including system alignment and wavelength dependence of the couplers. Strip-slot mode converters were fabricated and measured to present the exemplary insertion loss measurement process. A series of experimental results confirm that the insertion loss of the low-loss silicon photonic devices can be accurately and reliably obtained even the adopted couplers are wavelength-dependent, and the fibers are deviated 15 mu m from the horizontal direction and 110 mu m from the vertical direction, exhibiting excellent robustness to the experimental set-up. (c) 2019 Optical Society of America under the terms of the OSA Open Access Publishing Agreement |
| URI | http://hdl.handle.net/20.500.11897/546784 |
| ISSN | 1094-4087 |
| DOI | 10.1364/OE.27.019827 |
| Indexed | SCI(E) EI |
| Appears in Collections: | 信息科学技术学院 区域光纤通信网与新型光通信系统国家重点实验室 |
