Title Raman Spectra and Strain Effects in Bismuth Oxychalcogenides
Authors Cheng, Ting
Tan, Congwei
Zhang, Shuqing
Tu, Teng
Peng, Hailin
Liu, Zhirong
Affiliation Peking Univ, Coll Chem & Mol Engn, Beijing 100871, Peoples R China.
Peking Univ, Acad Adv Interdisciplinary Studies, Ctr Nanochem, Beijing 100871, Peoples R China.
Peking Univ, Beijing Natl Lab Mol Sci, State Key Lab Struct Chem Unstable & Stable Speci, Beijing 100871, Peoples R China.
Tsinghua Univ, Tsinghua Berkeley Shenzhen Inst, Low Dimens Mat & Devices Lab, Shenzhen 518055, Guangdong, Peoples R China.
Peking Univ, Coll Chem & Mol Engn, Beijing 100871, Peoples R China.
Peng, HL
Liu, ZR (reprint author), Peking Univ, Acad Adv Interdisciplinary Studies, Ctr Nanochem, Beijing 100871, Peoples R China.
Peng, HL
Liu, ZR (reprint author), Peking Univ, Beijing Natl Lab Mol Sci, State Key Lab Struct Chem Unstable & Stable Speci, Beijing 100871, Peoples R China.
Keywords TOTAL-ENERGY CALCULATIONS
WAVE BASIS-SET
THERMOELECTRIC PROPERTIES
2-DIMENSIONAL MATERIALS
TRANSPORT-PROPERTIES
CRYSTAL-STRUCTURE
BI2O2SE CERAMICS
LATTICE-DYNAMICS
HIGH-MOBILITY
SPECTROSCOPY
Issue Date 2018
Publisher JOURNAL OF PHYSICAL CHEMISTRY C
Citation JOURNAL OF PHYSICAL CHEMISTRY C. 2018, 122(34), 19970-19980.
Abstract A new type of two-dimensional layered semiconductor with weak electrostatic but not van der Waals interlayer interactions, Bi2O2Se, has been recently synthesized, which shows excellent air stability and ultrahigh carrier mobility. Herein, we combined theoretical and experimental approaches to study the Raman spectra of Bi2O2Se and related bismuth oxychalcogenides (Bi2O2 Te and Bi2O2S). The experimental peaks lie at 160 cm(-1) in Bi2O2 Se and at 147 and 340 cm(-1) in Bi2O2Te. They were fully consistent with the calculated results (159.89, 147.48, and 340.33 cm(-1)) and assigned to the out-of-plane A(1g), A(1g), and B-1g modes, respectively. Bi2O2S was predicted to have more Raman-active modes due to its lower symmetry. The shift in the predicted frequencies of Raman-active modes was also found to get softened as the interlayer interaction decreases from bulk to monolayer Bi2O2Se and Bi2O2Te. To reveal the strain effects on the Raman shifts, a universal theoretical equation was established based on the symmetry of Bi2O2Se and Bi2O2Te. It was predicted that the doubly degenerate modes split under in-plane uniaxial/shear strains. Under a rotated uniaxial strain, the changes in Raman shifts are anisotropic for degenerate modes, although Bi2O2Se and Bi2O2 Te were usually regarded as isotropic systems similar to graphene. This implies a novel method to identify the crystallographic orientation from Raman spectra under strain. These results have important consequences for the incorporation of two-dimensional bismuth oxychalcogenides into nanoelectronic devices.
URI http://hdl.handle.net/20.500.11897/517690
ISSN 1932-7447
DOI 10.1021/acs.jpcc.8b05475
Indexed SCI(E)
EI
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