Title Measuring the Charge of a Single Dielectric Nanoparticle Using a High-Q Optical Microresonator
Authors Chen, You-Ling
Jin, Wei-Liang
Xiao, Yun-Feng
Zhang, Xuming
Affiliation Hong Kong Polytech Univ, Dept Appl Phys, Hong Kong 999077, Hong Kong, Peoples R China.
Peking Univ, State Key Lab Mesoscop Phys, Beijing 100871, Peoples R China.
Peking Univ, Dept Phys, Beijing 100871, Peoples R China.
Princeton Univ, Dept Elect Engn, Princeton, NJ 08544 USA.
Keywords WHISPERING-GALLERY-MODE
RING-RESONATOR SENSOR
ELECTROMAGNETIC-WAVES
MICRORING RESONATORS
SENSING APPLICATIONS
RAYLEIGH-SCATTERING
LIGHT EXTINCTION
SURFACE-CHARGE
MICROSPHERES
MICROCAVITY
Issue Date 2016
Publisher PHYSICAL REVIEW APPLIED
Citation PHYSICAL REVIEW APPLIED.2016,6(4).
Abstract Measuring the charge of a nanoparticle is of great importance in many fields including optics, astronomy, biochemistry, atmospheric science, environmental engineering, and dusty plasma. Here, we propose to use a high-Q whispering-gallery-mode (WGM) optical microresonator to detect the surface and bulk charge of a dielectric nanoparticle. Because of the modification of nanoparticle conductivity induced by the surplus electrons, both the coupling strength between the nanoparticle and the WGM and the dissipation changes compared with the case of a neutral nanoparticle. The charge density can be inferred from the transmission spectrum of the WGM microresonator. By monitoring the mode splitting, the linewidth broadening or the resonance dip value of the transmission spectrum, surface (bulk) electron density as low as 0.007 nm(-2) (0.001 nm(-3)) can be detected for nanoparticles with negative (positive) electron affinity. The high sensitivity is attributed to the ultranarrow resonance linewidth and small mode volume of the microresonator.
URI http://hdl.handle.net/20.500.11897/458674
ISSN 2331-7019
DOI 10.1103/PhysRevApplied.6.044021
Indexed SCI(E)
Appears in Collections: 人工微结构和介观物理国家重点实验室

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