| Title | Algorithm of filling X bits in dual-run-length coding |
| Authors | Fang, Hao Yao, Bo Song, Xiao-Di Cheng, Xu |
| Affiliation | Room 1815, Science Building 1, Peking University, Beijing 100871, China |
| Issue Date | 2009 |
| Publisher | tien tzu hsueh paoacta electronica sinica |
| Citation | Tien Tzu Hsueh Pao/Acta Electronica Sinica.2009,37,(1),1-6. |
| Abstract | The dual-run-length codes are the important technique for test data compression. Test compression has two steps: first, the don't-care bits in the test data are filled with 0 or 1 s and the test data are divided into run sequences; second, every run in the sequences is converted to the compression code according to the given encoding algorithm. However, all the former existing papers focus on the second step, ignoring the importance of the first step thus to lose a certain potential compression ratio. In this paper, we address the importance of don't-care bits filling to test data compression ratio and propose a novel algorithm, which fills don't-care bits according to the selecting codes to achieve the higher compression ratio. This algorithm can be used with many dual-run-length codes without impacting on the decoder structure or the chip implementation flow. For the mainstream dual-run-length codes, the compression ratio is improved by 6%-9%. |
| URI | http://hdl.handle.net/20.500.11897/408019 |
| ISSN | 03722112 |
| Indexed | EI |
| Appears in Collections: | 待认领 |
