Title | UWB SoC Co-design with ESD protection |
Authors | Wang, Xin Lin, Lin Tang, He Liu, Jian Fang, Qiang Zhao, Hui Wang, Albert Fan, S.Q. Guan, X. Zhao, B. Shi, Zitao Cheng, Yuhua Qin, Bo Yang, Li-Wu He, Jun |
Affiliation | Dept. of EE, University of California, United States Fairchild Semi., United States Peking University, China CitrusCom Semiconductor, China SMIC, China GSMC, China |
Issue Date | 2010 |
Citation | 2010 International SoC Design Conference, ISOCC 2010.Incheon, Korea, Republic of. |
Abstract | This paper discusses critical aspects for co-design of ultra wideband (UWB) system-on-chip (SoC) and on-chip electrostatic discharge (ESD) protection, which are beyond simple data rate and bandwidth considerations. UWB-ESD co-design techniques and experiment results are presented. The designs were implemented in a commercial 0.18??m RFCMOS. ?2010 IEEE. |
URI | http://hdl.handle.net/20.500.11897/329690 |
DOI | 10.1109/SOCDC.2010.5682986 |
Indexed | EI |
Appears in Collections: | 待认领 |