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| Issue Date | Title | Author(s) |
| 2024 | A 16.38TOPS and 4.55POPS/W SRAM Computing-in-Memory Macro for Signed Operands Computation and Batch Normalization Implementation | Qiao, Xin; Guo, Qingyu; Tang, Xiyuan; Song, Jiahao; Wei, Renjie; Li, Meng; Wang, Runsheng; Wang, Yuan |
| 2021 | A 16Kb Transpose 6T SRAM In-Memory-Computing Macro based on Robust Charge-Domain Computing | Song, Jiahao; Wang, Yuan; Tang, Xiyuan; Wang, Runsheng; Huang, Ru |
| Feb-2023 | A 28 nm 16 Kb Bit-Scalable Charge-Domain Transpose 6T SRAM In-Memory Computing Macro | Song, Jiahao; Tang, Xiyuan; Qiao, Xin; Wang, Yuan; Wang, Runsheng; Huang, Ru |
| 2022 | A 28-nm 198.9-TOPS/W Fault-Tolerant Stochastic Computing Neural Network Processor | Hu, Yixuan; Zhang, Yawen; Wang, Runsheng; Zhang, Zuodong; Song, Jiahao; Tang, Xiyuan; Qian, Weikang; Wang, Yanzhi; Wang, Yuan; Huang, Ru |
| 2022 | A 3T eDRAM In-Memory Physically Unclonable Function With Spatial Majority Voting Stabilization | Song, Jiahao; Luo, Haoyang; Tang, Xiyuan; Xu, Kuan; Ji, Zhigang; Wang, Yuan; Wang, Runsheng; Huang, Ru |
| 2023 | A 4-bit Calibration-Free Computing-In-Memory Macro With 3T1C Current-Programed Dynamic-Cascode Multi-Level-Cell eDRAM | Song, Jiahao; Tang, Xiyuan; Luo, Haoyang; Zhang, Haoyi; Qiao, Xin; Sun, Zixuan; Yang, Xiangxing; Wu, Zihan; Wang, Yuan; Wang, Runsheng; Huang, Ru |
| Jun-2022 | A 65 nm 73 kb SRAM-Based Computing-In-Memory Macro With Dynamic-Sparsity Controlling | Qiao, Xin; Song, Jiahao; Tang, Xiyuan; Luo, Haoyang; Pan, Nanbing; Cui, Xiaoxin; Wang, Runsheng; Wang, Yuan |
| 2015 | Accelerated Aging in Analog and Digital Circuits With Feedback | Sutaria, Ketul B.; Mohanty, Abinash; Wang, Runsheng; Huang, Ru; Cao, Yu |
| 2020 | Accurate and Energy-Efficient Implementation of Non-Linear Adder in Parallel Stochastic Computing Using Sorting Network | Zhang, Yawen; Wang, Runsheng; Hu, Yixuan; Qian, Weikang; Wang, Yanzhi; Wang, Yuan; Huang, Ru |
| 2023 | Accurate yet Efficient Stochastic Computing Neural Acceleration with High Precision Residual Fusion | Hu, Yixuan; Zhang, Tengyu; Wei, Renjie; Li, Meng; Wang, Runsheng; Wang, Yuan; Huang, Ru |
| Feb-2023 | Adaptive Multioutput Gradient RBF Tracker for Nonlinear and Nonstationary Regression | Sun, Zixuan; Wang, Zirui; Wang, Runsheng; Zhang, Lining; Zhang, Jiayang; Zhang, Zuodong; Song, Jiahao; Wang, Da; Ji, Zhigang; Huang, Ru |
| 2015 | Adding the Missing Time-Dependent Layout Dependency into Device-Circuit-Layout Co-Optimization -New Findings on the Layout Dependent Aging Effects | Ren, Pengpeng; Xu, Xiaoqing; Hao, Peng; Wang, Junyao; Wang, Runsheng; Li, Ming; Wang, Jianping; Bu, Weihai; Wu, Jingang; Wong, Waisum; Yu, Shaofeng; Wu, Hanming; Lee, Shiuh-Wuu; Pan, David Z.; Huang, Ru |
| 2016 | Adding the missing time-dependent layout dependency into device-circuit-layout co-optimization-New findings on the layout dependent aging effects | Ren, Pengpeng; Xu, Xiaoqing; Hao, Peng; Wang, Junyao; Wang, Runsheng; Li, Ming; Wang, Jianping; Bu, Weihai; Wu, Jingang; Wong, Waisum; Yu, Shaofeng; Wu, Hanming; Lee, Shiuh-Wuu; Pan, David Z.; Huang, Ru |
| Sep-2021 | Aging-Aware Gate-Level Modeling for Circuit Reliability Analysis | Zhang, Zuodong; Wang, Runsheng; Shen, Xuguang; Wu, Dehuang; Zhang, Jiayang; Zhang, Zhe; Wang, Joddy; Huang, Ru |
| 2007 | Analog/RF performance of Si nanowire MOSFETs and the impact of process variation | Wang, Runsheng; Zhuge, Jing; Huang, Ru; Tian, Yu; Xiao, Han; Zhang, Liangliang; Li, Chen; Zhang, Xing; Wang, Yangyuan |
| 2017 | Anomalous random telegraph noise in nanoscale transistors as direct evidence of two metastable states of oxide traps | Guo, Shaofeng; Wang, Runsheng; Mao, Dongyuan; Wang, Yangyuan; Huang, Ru |
| Jul-2020 | Bias and geometry dependence of total-ionizing-dose effects in SOI FinFETs | Ren, Zhexuan; An, Xia; Li, Gensong; Wang, Runsheng; Xu, Nuo; Zhang, Xing; Huang, Ru |
| Jan-2022 | Body Bias Dependence of Bias Temperature Instability (BTI) in Bulk FinFET Technology | Zhang, Jiayang; Wang, Zirui; Wang, Runsheng; Sun, Zixuan; Huang, Ru |
| 2018 | Body Bias Dependence of Hot Carrier Degradation (HCD) in Advanced FinFET Technology | Zhang, Jiayang; Sun, Zixuan; Wang, Runsheng; Yu, Zhuoqing; Ren, Pengpeng; Huang, Ru |
| 2021 | Can Emerging Computing Paradigms Help Enhancing Reliability Towards the End of Technology Roadmap? | Wang, Runsheng; Zhang, Zuodong; Zhang, Yawen; Hu, Yixuan; Sun, Yanan; Qian, Weikang; Huang, Ru |
