Browsing by Author Jiang, Haojie
Showing results 1 to 2 of 2
Issue Date | Title | Author(s) |
2016 | Effect of interface and bulk traps on the C-V characterization of a LPCVD-SiNx/AlGaN/GaN metal-insulator-semiconductor structure | Bao, Qilong; Huang, Sen; Wang, Xinhua; Wei, Ke; Zheng, Yingkui; Li, Yankui; Yang, Chengyue; Jiang, Haojie; Li, Junfeng; Hu, Anqi; Yang, Xuelin; Shen, Bo; Liu, Xinyu; Zhao, Chao |
6-Dec-2021 | Identification of bulk and interface state-induced threshold voltage instability in metal/SiNx(insulator)/AlGaN/GaN high-electron-mobility transistors using deep-level transient spectroscopy | Yao, Yixu; Jiang, Qimeng; Huang, Sen; Wang, Xinhua; Luo, Xiaorong; Jin, Hao; Guo, Fuqiang; Yin, Haibo; Shi, Jingyuan; Jiang, Haojie; Li, Junfeng; Wang, Wenwu; Shen, Bo; Wei, Ke; Liu, Xinyu |