Issue Date | Title | Author(s) |
2012 | Design and analysis of new silicided nano crystal dots field programmable ESD protection structures in BiCMOS | Ma, Rui; Shi, Zitao; Wang, Xin; Liu, Jian; Zhao, Hui; Wang, Li; Dong, Zongyu; Zhang, Chen; Lin, Lin; Zhou, Huimei; Wang, Albert; Liu, Jianlin; Zhao, Bin; Cheng, Yuhua |
2013 | Heterogeneous integration of nano enabling devices for 3D ICs | Wang, Li; Ma, Rui; Zhang, Chen; Dong, Zongyu; Wang, Xin; Shi, Zitao; Liu, Jian; Lin, Lin; Zhao, Hui; Lu, Fei; Fang, Qiang; Yang, Chen; Zhan, Jing; Ren, Tianling; Li, Xinxin; Huang, Ru; Wang, Albert |
2013 | Nano enabled 3D integration of on-chip ESD protection for ICs | Wang, Li; Zhang, Chen; Dong, Zongyu; Ma, Rui; Wang, Xin; Shi, Zitao; Zhao, Hui; Liu, Jian; Lu, Fei; Wang, Albert; Cheng, Yuhua |
2013 | Post-Si Programmable ESD Protection Circuit Design: Mechanisms and Analysis | Wang, Xin; Shi, Zitao; Liu, Jian; Lin, Lin; Zhao, Hui; Wang, Li; Ma, Rui; Zhang, Chen; Dong, Zongyu; Fan, Siqiang; Tang, He; Wang, Albert; Cheng, Yuhua; Zhao, Bin; Zhang, Zhigang; Chi, Baoyong; Ren, Tian-Ling |
2013 | Post-si programmable ESD protection circuit design: Mechanisms and analysis | Wang, Xin; Shi, Zitao; Liu, Jian; Lin, Lin; Zhao, Hui; Wang, Li; Ma, Rui; Zhang, Chen; Dong, Zongyu; Fan, Siqiang; Tang, He; Wang, Albert; Cheng, Yuhua; Zhao, Bin; Zhang, Zhigang; Chi, Baoyong; Ren, Tian-Ling |
2013 | Scalable behavior modeling for nano crossbar ESD protection structures by Verilog-A | Wang, Li; Wang, Xin; Shi, Zitao; Ma, Rui; Liu, Jian; Dong, Zongyu; Zhang, Chen; Lu, Fei; Lin, Lui; Zhao, Hui; Wang, Albert; Cheng, Yuhua |
2016 | A Systematic Study of ESD Protection Co-Design With High-Speed and High-Frequency ICs in 28 nm CMOS | Lu, Fei; Ma, Rui; Dong, Zongyu; Wang, Li; Zhang, Chen; Wang, Chenkun; Chen, Qi; Wang, X. Shawn; Zhang, Feilong; Li, Cheng; Tang, He; Cheng, Yuhua; Wang, Albert |